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AFM Atomic Force Microscopy and Scanning Probe Microscopy Calibration
SEM Scanning Electron Microscopy Calibration Back Scattered Electron Test Specimens Mounts and Adapters for SEM Calibration
TEM Transmission Electron Microscopy and STEM Test Specimens
EDS/WDS/EPMA/XPS Analysis Standards PELCO® XCS - EDS Calibration Standards EDS/WDS/XPS Reference Standards (UHV-EL) SEM/X-Ray Calibration (X-Checker®) Faraday Cup for Electron Beam Current Measurement PELCO® NiOx for Analytical Electron Microscope (AEM) Synthetic Particle Specimen for Gunshot Residue SEM/EDX Calibration
FIB, Focus Ion Beam Standards Resolution / Magnification same as: Scanning Electron Microscopy Calibration
Forensic - GSR Synthetic Particle Specimen for Gunshot Residue SEM/EDX Calibration
Calibration Guides / Software Magnification Calibration Calculator, 2000 lines/mm Ultrastructure Size Calculator
Light Microscope Calibration Pelcotec™ LMS-20G Large Area Calibration Standard Dual, Graduated, Metric and Inch Scale Stage Micrometer for Transmitted Light Micro-Ruler MR-1 Linear Glass Scales Standard Stage Micrometers PRO Stage Micrometers England Finder S7 Slide Counting Chamber/Counting Slides Fluorescence Reference Slides
Exclusively fromTed Pella, Inc.
Use this guide in conjunction with a 2000 lines/mm (500nm pitch) cross line grating replica for accurate determination and calibration of TEM, SEM, AFM, and STM magnification. By measuring the distance between the lines of the replica pattern, the image magnification can be read directly from the calculator.
2000 lines/mm or 500nm grating replica specimens - our catalog numbers 673, 674 series, 677, 677-AFM, and 677-STM.
Convenient Pocket-sized slide rule calculator for quick ultrastructure measurements. Gives the actual size represented by each millimeter on a micrograph at any magnification. The magnification range is x10 to x100,000. Readings are shown in µm, nm and Å and represent each 1mm on the micrograph. English, French and German. Waterproof card, 80 x 170mm (3.15" x 6.7").