SPS Test Specimen with Synthetic GSR particles.
This Synthetic Particle Specimen (SPS) has been specifically designed for the adjustment
and validation of analytical SEM/EDX systems used for automated analysis of GSR samples.
It is especially useful for quick system validation checks and quality assurance procedures.
The SPS-TM-A test specimen is manufactured on a glassy carbon substrate with a size of 8 x 8mm
with various sizes of synthetic particles containing Pb, Sb and Ba. The synthetic GSR particles
with a size varying from 0.5 to 2.0µm are statistically distributed in an area of 6 x 6mm. For
improved conductivity, the SPS test specimen has been coated with a thin layer of carbon. The SPS
test specimens are made with a defined number of Pb/Sb/Ba particles. However, some particles can
be missing or could have been on a different location. Therefore, each SPS test specimen has been
individually tested and comes with a certificate stating the exact number of Pb/Sb/Ba particles
and their locations.
- 8 x 8mm glassy carbon substrate on standard pin stub
- Approximately 150 Pb/Sb/Ba particles, sizes are 0.5 / 0.75 / 1.0 / 1.25 / 1.5 and 2.0µm
- 4 Pb/Sb/Ba particles with a sizes of approximately. 12µm
- Carbon coated
- Each SPS test specimen has unique ID number
- Certificatied with X/Y location map and confirming chemical composition of the particles
It is recommended that the BSE signal of the SEM is used for imaging the particles since this a
high contrast signal difference between the Pb/Ba/Sb particles and the glassy carbon substrate.
Beam current of the SEM should not exceed 2 nA. Instructions are supplied with the SPS test specimen.
For the evaluation of the automated GSR measurements it is recommend that the data obtained from the
Pb/Ba/Sb particles (in particular their X-Y coordinates and the particle size) is displayed as an X-Y
plot. When using an appropriate display area, a direct comparison can be made of the positions and the
size of the detected particles with the particle matrix.
Test specimen for checking and validating automated particle analysis using SEM/EDX systems
This test specimen has 15 lines of particles with different sizes with 20 particles spaced equally
per line. With the known particle sizes and positions this test specimen can be used to test and
validate SEM/EDX systems used for automated particle analysis applications.
Short test sample description:
- 10 lines x 20 particles point matrix
- 20 particles of the same size are on a virtual line, equally spaced by 150µm
- Particles sizes are 2.0 / 1.8 / 1.6 / 1.5 / 1.4 /1.3 / 1.2 / 1.1 / 1.0 / 0.9 / 0.8 / 0.7 / 0.6 / 0.5 and 0.4µm (some particles can be missing)
- Each size category is labeled at the beginning of the line
- Multilayer structure with PbO / BaF2 and Sb2O3 particles
- Glassy carbon substrate
- Each test specimen holds two sets of the 10 x 20 point matrix.
This test specimen is particularly useful for calibration of fields/SEM stage, particle
measurements/classification, EDX analysis and to correct to overlap, gaps and rotation of the fields.
It is also useful for aligning the scan rotation with the X/Y movements of the SEM stage.
To avoid contamination, we recommend storing the SPS-TM-A GSR test specimen in the
PELCO® SEM
Sample Stub Vacuum Desiccator #16179
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