PELCO^® XCS EDS Calibration Standards

The PELCO^® XCS EDS Calibration Standards are practical, high quality and compact EDS calibration standards using a high purity 12.7mm (1/2") pin stub as retainer. The small size of the pin stub allows for using the PELCO^® XCS Calibration Standard alongside specimens on readily available multi pin stub holders. This enables quick in-situ calibration and regular performance tests of the EDS system, Back Scattered Electron Detector and light element detection performance of the EDS detector. The pure elements and compounds are mounted in the 12.7mm (1/2") stubs using a highly conductive silver epoxy. All PELCO^® XCS Calibration Standards are carbon coated for improved conductivity. The PELCO^® XCS EDS Calibration Standards are available in 7 fixed configurations:

PELCO® XCS-5 Itended for EDS calibration and contains ANSI 316 stainless steel, SiO2, Mn, B, C and a 200µm Cu aperture grid in a 12.7mm aluminum pin stub. Representative Certificate of Suitability for Purpose - for PELCO® XCS-5 Calibration Standard (256KB PDF)
PELCO® XCS-6 Intended for EDS calibration and contains ANSI 316 stainless steel, SiO2, Mn, B, C and a 200 mesh Cu grid in a 12.7mm aluminum pin stub. Representative Certificate of Suitability for Purpose - for PELCO® XCS-6 Calibration Standard (281KB PDF)
PELCO® XCS-7 Intended for BSD response curve calibration for GSR and contains, Ge, Nb, Au, C, Si and a 200µm Cu aperture grid in a 12.7mm aluminum pin stub. Representative Certificate of Suitability for Purpose - for PELCO® XCS-7 Calibration Standard (274KB PDF)
PELCO® XCS-22 Intended for BSD response curve calibration for GSR and contains, Ge, Rh, Au, C, Si, Co and a 200µm Cu aperture grid in a 12.7mm aluminum pin stub. Compatible with Oxford Instruments EDS Systems. Representative Certificate of Suitability for Purpose - for PELCO® XCS-22 Calibration Standard (236KB PDF)
PELCO® XCS-8 Intended for EDS calibration and contains ANSI 316 stainless steel, SiO2, Mn, BN, C and a 200µm Cu aperture in a 12.7mm aluminum pin stub. Representative Certificate of Suitability for Purpose - for PELCO® XCS-8 Calibration Standard (279KB PDF)

PELCO® XCS-10 Intended for BSD response curve calibration and contains C, Si, Ti, Co, Ge, Nb, Sn, Ho, Ir, Bi and a 200µm Cu aperture in a 12.7mm aluminum pin stub. For sale in the U.S.A. only. Representative Certificate of Suitability for Purpose - for PELCO® XCS-10 Calibration Standard (273KB PDF)
PELCO® XCS-12 Intended for checking light element analysis performance and contains CaB6, SiC, CrN, Fe2O3, CaF2 and a 200µm Cu aperture in a 12.7mm aluminum pin stub. Representative Certificate of Suitability for Purpose - for PELCO® XCS-12 Calibration Standard (244KB PDF)

Each PELCO^® XCS EDS X-ray calibration standard comes with a certificate issued by the manufacturer stating the purity and origin of the elements, compounds or alloys. For the ANSI 316 stainless steel, a Mill Test Certificate is available. These are not traceable analysis certificates..