PELCO^® XCS EDS Calibration Reference

PELCO^® XCS-5

Intended for essential EDS calibration and contains AISI 316L stainless steel, SiO2, Mn, B, C and a 200µm Cu aperture grid that serves as a Cu/Al reference as well as a Faraday cup, all embedded in a 12.7mm diameter aluminum pin stub.

PELCO^® XCS-6

Intended for EDS calibration and contains AISI 316L stainless steel, SiO2, Mn, B, C and a 200 mesh Cu grid which serves as a Cu/Al reference and a size reference with a 127 micron pitch, embedded  in a 12.7mm diameter aluminum pin stub.

PELCO^® XCS-7

Intended for BSD response curve calibration, the standard contains elements evenly spaced in the periodic table.  It contains, Ge, Nb, Au, C, Si and a 200µm Cu aperture grid for use as a Cu/Al reference and Faraday cup, embedded in a 12.7mm diameter aluminum pin stub. These standards are commonly used for tuning GSR (gun shot residue) software.

PELCO^® XCS-22

Intended for BSD response curve calibration for GSR and contains, Ge, Rh, Au, C, Si, Co and a 200µm Cu aperture grid in a 12.7mm diameter aluminum pin stub. Contains a cobalt sample, which is standard for calibration of Oxford Instruments EDS Systems.

PELCO^® XCS-8

Similar to the XCS-5, but with the addition of the nitrogen line from boron nitride. Intended for EDS calibration and contains AISI 316L stainless steel, SiO2, Mn, BN, C and a 200µm Cu aperture in a 12.7mm diameter aluminum pin stub.

PELCO^® XCS-10

Intended for BSD response curve calibration and contains C, Si, Ti, Co, Ge, Nb, Sn, Ho, Ir, Bi and a 200µm Cu aperture in a 12.7mm diameter aluminum pin stub. For sale in the U.S.A. only.

PELCO^® XCS-12

Intended for checking light element analysis performance and contains CaB6, SiC, CrN, Fe2O3, CaF2 and a 200µm Cu aperture in a 12.7mm diameter aluminum pin stub.

NEW PELCO^® XCS-CL

The XCS-CL contains a series of mineral samples that exhibit bright fluorescence suitable as a reference for cathodoluminescence detectors. As these produce considerable light, it can also be used to test light tightness of EDS detector windows. Samples are mounted on a polished standard 12.7mm pin stub.

The PELCO^® XCS-CL contains:

• Benitoite – BaTiSi3O9
• Apatite – Ca5(PO4)3(F,Cl,OH)
• Spinel – MgAl2O4
• Corundum – Al2O3
• Chrysoberyl – BeAl2O4
• Fluorite – CaF2
• Calcite – CaCO3 

The materials used are natural mineral samples and may contain small amounts of secondary minerals.

NEW PELCO^® XCS-PD

The XCS-PD reference contains a series of sample minerals with elements that overlap in the EDS spectrum. It is useful as a challenging test sample for assessing peak deconvolution and tuning auto peak deconvolution algorithms.

The PELCO^® XCS-PD contains:

• Zinkenite – Pb9Sb22S42
• Galena – PbS
• Enargite – Cu3AsS4
• Molybdenite – MoS2
• Wulfenite – PbMoO4
• Galkhaite – (Cs,Tl) (Hg,Cu,Zn)6(As,Sb)4S12
• Kleinite – Hg2N(Cl,SO4).n(H2O)
• Benitoite – BaTiSi3O9
• Kosnarite – KZr2(PO4)3
• Cinnabar – HgS

The materials used are natural mineral samples and may contain small amounts of secondary minerals.

Samples are mounted on a standard 12.7mm diameter pin stub.

NEW PELCO^® XCS-R

The XCS-R contains a series of Raman-active minerals including common polymorphs of SiO2, TiO2, and others that are difficult to distinguish by other means. It can serve as a reference sample for Raman microscopes, and for SEM systems incorporating Raman.

• Silica – SiO2
• Quartz – SiO2
• Chalcedony – SiO2
• Aragonite – CaCO3
• Calcite – CaCO3
• Pyrite – FeS2
• Marcasite – FeS2
• Rutile – TiO2
• Anatase – TiO2
• Brookite – TiO2

The materials used are natural mineral samples and may contain small amounts of secondary minerals.

Samples are mounted in clear resin on a polished 12.7mm diameter pin stub and carbon-coated.