Model >>> Multi75-G / Multi75Al & Multi75Al-G / Multi75GD / Multi75GB & -G / ElectriMulti75 & -G / MagneticMulti75 & -G / Multi75DLC
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Technical Data:
|
|
Value
|
Range
|
Resonant Freq.
|
75 kHz
|
+/-15 kHz
|
Force Constant
|
3 N/m
|
1 - 7 N/m
|
Length
|
225 µm
|
+/-10 µm
|
Mean Width
|
28 µm
|
+/-5 µm
|
Thickness
|
3 µm
|
+/-1 µm
|
Tip Height
|
17 µm
|
+/-2 µm
|
Tip Set Back
|
15 µm
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+/-5 µm
|
Tip Radius
|
<10 nm (Multi75; Multi75Al; Multi75GD)
<25nm (ElectriMulti75; Multi75GB)
<60nm (MagneticMulti75)
<15 nm (Multi75DLC)
Also see individual probes. |
Half Cone Angle
|
20°-25° along cantilever axis
25°-30° from side
10°-at the apex
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Contact Resistance
|
300 ohms on platinum thin film surface
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|
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Multi75-G
Tip radius <10nm |
Application:
|
Force Modulation, Light Tapping
|
General:
|
Rotated Monolithic Silicon Probe
Symmetric Tip Shape
Alignment Grooves
(Chipsize 3.4 x 1.6 x 0.3mm) |
Coating:
|
None
|
|
|
Prod #
| Description
| Unit
| Price
| Order / Quote
|
MULTI75-G-10
| Silicon AFM Probes, Multi 75 -G, no coating
| pkg/10
| $250.00
|
|
MULTI75-G-50
| Silicon AFM Probes, Multi 75 -G, no coating
| pkg/50
| 1062.50
|
|
MULTI75-G-W
| Silicon AFM Probes, Multi 75 -G, no coating
| pkg/380
| P.O.R.
|
|
|
Multi75Al
Tip radius <10nm |
Application:
|
Force Modulation, Light Tapping
|
General:
|
Rotated Monolithic Silicon Probe
Symmetric Tip Shape
With or without Alignment Grooves
(Chipsize 3.4 x 1.6 x 0.3mm)
|
Coating:
|
30nm Al for enhanced reflectivity
|
|
|
Prod #
| Description
| Unit
| Price
| Order / Quote
|
MULTI75AL-W
| Silicon AFM Probes, Multi 75 Al, Aluminum Reflex coating
| pkg/380
| P.O.R.
|
|
Multi75AL with Alignment Grooves:
|
MULTI75AL-G-10
| Silicon AFM Probes, Multi 75 Al -G, Aluminum Reflex coating
| pkg/10
| 280.00
|
|
MULTI75AL-G-50
| Silicon AFM Probes, Multi 75 Al -G, Aluminum Reflex coating
| pkg/50
| 1112.50
|
|
MULTI75AL-G-W
| Silicon AFM Probes, Multi 75 Al -G, Aluminum Reflex coating
| pkg/380
| P.O.R.
|
|
|
Multi75GD
Tip radius <10nm |
Application:
|
Force Modulation, Light Tapping
|
General:
|
Rotated Monolithic Silicon Probe
Symmetric Tip Shape
(Chipsize 3.4 x 1.6 x 0.3mm)
|
Coating:
|
70nm Au on back of cantilever
|
|
|
Prod #
| Description
| Unit
| Price
| Order / Quote
|
MULTI75GD-10
| Silicon AFM Probes, Multi 75 GD, Au coated
| pkg/10
| $325.00
|
|
MULTI75GD-50
| Silicon AFM Probes, Multi 75 GD, Au coated
| pkg/50
| 1350.00
|
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Multi75GB
Tip radius <25nm |
Application: |
Force Modulation, Light Tapping, special application
|
General:
|
Rotated Monolithic Silicon Probe
Symmetric Tip Shape
Alignment Grooves
(Chipsize 3.4 x 1.6 x 0.3mm)
|
Coating:
|
70nm Au on both sides of cantilever
|
|
|
Prod #
| Description
| Unit
| Price
| Order / Quote
|
MULTI75GB-G-10
| Silicon AFM Probes, Multi 75 GB -G, overall Au coated
| pkg/10
| $325.00
|
|
MULTI75GB-G-50
| Silicon AFM Probes, Multi 75 GB -G, overall Au coated
| pkg/50
| 1350.00
|
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ElectriMulti75-G
Tip radius <25nm |
Application:
|
Force Modulation, Light Tapping and Electric Modes like:
• Scanning Capacitance Microscopy (SCM)
• Electrostatic Force Microscopy (EFM)
• Kelvin Probe Force Microscopy (KFM)
• Scanning Probe lithography
|
General:
|
Rotated Monolithic Silicon Probe
Symmetric Tip Shape
Alignment Grooves
(Chip size 3.4 x 1.6 x 0.3mm)
|
Coating:
|
Electrically conductive Cr/Pt on both sides of cantilever. 5nm Cr covered with 25nm Pt.
|
|
|
Contact Resistance: 300 ohms on Pt thin film surface
Prod #
| Description
| Unit
| Price
| Order / Quote
|
Multi75E with Alignment Grooves:
|
MULTI75E-G-10
| Silicon AFM Probes, ElectriMulti 75 -G, overall Cr/Pt coated
| pkg/10
| $300.00
|
|
MULTI75E-G-50
| Silicon AFM Probes, ElectriMulti 75 -G, overall Cr/Pt coated
| pkg/50
| 1312.50
|
|
|
MagneticMulti75
Tip radius <60nm |
Application:
|
Magnetic Force Microscopy (MFM)
|
General:
|
Rotated Monolithic Silicon Probe
Symmetric Tip Shape
Alignment Grooves
(Chip size 3.4 x 1.6 x 0.3mm)
|
Coating:
|
Tip side - Magnetic
Detector side - Aluminum
|
|
|
Prod #
| Description
| Unit
| Price
| Order / Quote
|
MULTI75M-G-10
| Silicon AFM Probes, MagneticMulti 75 -G, Magnetic/Al coated
| pkg/10
| $300.00
|
|
MULTI75M-G-50
| Silicon AFM Probes, MagneticMulti 75 -G, Magnetic/Al coated
| pkg/50
| 1312.50
|
|
|
Multi75DLC
Tip radius <15nm |
Application:
|
Force Modulation Mode, Pulsed Force Mode (PFM)
|
General:
|
Rotated Monolithic Silicon Probe
Symmetric Tip Shape
Alignment Grooves
(Chipsize 3.4 x 1.6 x 0.3mm)
|
Coating:
|
Diamond-Like-Coating on tip side of cantilever, 15nm thick
Aluminum Reflex coating on detector side of cantilever, 30nm thick
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation
of features
over 200nm.
|
|
|
Prod #
| Description
| Unit
| Price
| Order / Quote
|
MULTI75DLC-10
| Silicon AFM Probes, Multi 75 DLC, DLC coating on tip
| pkg/10
| $375.00
|
|
MULTI75DLC-50
| Silicon AFM Probes, Multi 75 DLC, DLC coating on tip
| pkg/50
| 1562.50
|
|
or go to BudgetComboBox for a mixed box of probes
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Model >>> Contact / ContAL & ContAL-G / ContGD / ContGB / ElectriCont & -G / ContDLC
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Technical Data:
|
|
Value
|
Range
|
Resonant Freq.
|
13 kHz
|
+/-4 kHz
|
Force Constant
|
0.2 N/m
|
0.07 - 0.4 N/m
|
Length
|
450 µm
|
+/-10 µm
|
Mean Width
|
50 µm
|
+/-5 µm
|
Thickness
|
2 µm
|
+/-1 µm
|
Tip Height
|
17 µm
|
+/-2 µm
|
Tip Set Back
|
15 µm
|
+/-5 µm
|
Tip Radius
|
<10 nm (Contact; ContAL; ContGD; ContGb)
<25nm (ElectriCont)
<15nm (ContDLC)
Also see individual probes. |
Half Cone Angle
|
20°-25° along cantilever axis
25°-30° from side
10°-at the apex
|
|
|
Contact Tip radius <10nm |
Application:
|
Contact Mode, Pulsed Force Mode (PFM)
|
General:
|
Rotated Monolithic silicon probe
Symetric Tip Shape
Alignment Grooves
(except for 1, see below)
(Chipsize 3.4 x 1.6 x 0.3mm)
|
Coating:
|
None
|
|
|
Prod #
| Description
| Unit
| Price
| Order / Quote
|
CONTACT-G-10
| Silicon AFM Probes, Contact -G, no coating
| pkg/10
| $267.00
|
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CONTACT-G-50
| Silicon AFM Probes, Contact -G, no coating
| pkg/50
| 1133.00
|
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CONTACT-G-W
| Silicon AFM Probes, Contact -G, no coating
| pkg/380
| P.O.R.
|
|
|
ContAL
Tip radius <10nm |
Application:
|
Contact Mode, Pulsed Force Mode (PFM)
|
General:
|
Rotated Monolithic silicon probe
Symetric Tip Shape
Alignment Grooves or None
(Chipsize 3.4 x 1.6 x 0.3mm)
|
Coating:
|
30nm Al for enhanced reflectivity
|
|
|
Prod #
| Description
| Unit
| Price
| Order / Quote
|
CONTAL-W
| Silicon AFM Probes, Cont Al, Aluminum Reflex coating
| pkg/380
| P.O.R.
|
|
ContAl with Alignment Grooves:
|
CONTAL-G-10
| Silicon AFM Probes, Cont Al -G, Aluminum Reflex coating
| pkg/10
| 267.00
|
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CONTAL-G-50
| Silicon AFM Probes, Cont Al -G, Aluminum Reflex coating
| pkg/50
| 1186.50
|
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CONTAL-G-W
| Silicon AFM Probes, Cont Al -G, Aluminum Reflex coating
| pkg/380
| P.O.R.
|
|
|
ContGD
Tip radius <10nm |
Application:
|
Contact Mode, Pulsed Force Mode (PFM)
|
General:
|
Rotated Monolithic silicon probe
Symetric Tip Shape
Alignment Grooves
(Chipsize 3.4 x 1.6 x 0.3mm)
|
Coating:
|
70nm Au on back of cantilever
|
|
|
Prod #
| Description
| Unit
| Price
| Order / Quote
|
CONTGD-G-10
| Silicon AFM Probes, Cont GD, part Au coated
| pkg/10
| $347.00
|
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CONTGD-G-50
| Silicon AFM Probes, Cont GD, part Au coated
| pkg/50
| 1440.00
|
|
|
ContGB
Tip radius <25nm |
Application:
|
Contact Mode, Pulsed Force Mode (PFM)
|
General:
|
Rotated Monolithic silicon probe
Symetric Tip Shape
Alignment Grooves
(Chipsize 3.4 x 1.6 x 0.3mm)
|
Coating:
|
70nm Au on both sides of cantilever
|
|
|
Prod #
| Description
| Unit
| Price
| Order / Quote
|
CONTGB-G-10
| Silicon AFM Probes, Cont GB -G, overall Au coated
| pkg/10
| $347.00
|
|
CONTGB-G-50
| Silicon AFM Probes, Cont GB -G, overall Au coated
| pkg/50
| 1440.00
|
|
|
ElectriCont-G
Tip radius <25nm |
Application:
|
Contact Mode, Pulsed Force Mode (PFM) and Electric Modes like:
• Scanning Capacitance Microscopy (SCM)
• Electrostatic Force Microscopy (EFM)
• Kelvin Probe Force Microscopy (KFM)
• Scanning Probe Lithography |
General:
|
Rotated Monolithic silicon probe
Symetric Tip Shape
Alignment Grooves
(Chip size 3.4 x 1.6 x 0.3mm)
|
Coating:
|
Electrically conductive Cr/Pt on both sides of cantilever. 5nm Cr covered with 25nm Pt.
|
|
|
Contact Resistance: 300 ohms on Pt thin film surface
Prod #
| Description
| Unit
| Price
| Order / Quote
|
with Alignment Grooves
|
CONTE-G-10
| Silicon AFM Probes, ElectriCont-G, overall Cr/Pt coating
| pkg/10
| $320.00
|
|
CONTE-G-50
| Silicon AFM Probes, ElectriCont-G, overall Cr/Pt coating
| pkg/50
| 1666.50
|
|
|
ContDLC
Tip radius <15nm |
Application:
|
Contact Mode
|
General:
|
Rotated Monolithic silicon probe
Symmetric Tip Shape
Alignment grooves
(Chip size 3.4 x 1.6 x 0.3mm)
|
Coating:
|
Diamond-Like-Coating on tip side of cantilever, 15nm thick
Aluminum Reflex coating on detector side of cantilever, 30nm thick
This probe uses an "on scan angle" symmetric tip to provide a more symmetric representation
of features
over 200nm.
|
|
|
Prod #
| Description
| Unit
| Price
| Order / Quote
|
CONTDLC-10
| Silicon AFM Probes, Cont DLC, DLC coating on tip
| pkg/10
| $375.00
|
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CONTDLC-50
| Silicon AFM Probes, Cont DLC, DLC coating on tip
| pkg/50
| 1837.50
|
|
go to BudgetComboBox for a mixed box of probes
|