AuSome™ Resolution and Calibration Standard
for SEM, FIB and FESEM

A challenge with nanoscale microscopy is clear imaging down to the nm level. Focus, astigmatism and working distance are important factors and slight adjustments in each can make the difference in getting a publication quality image. An additional challenge is to correctly measure features at such high magnifications. To assist the discerning microscopist, Ted Pella, Inc presents the new AuSome™ combined resolution and calibration standards for nanoscale imaging. The AuSome™ resolution and calibration standards consist of known and uniform gold particles on a silicon chip. The known particle size paired with uniformity provides a real indication of the performance of the SEM, FIB or FESEM and can be used for calibration purposes well below 100nm and goes beyond the features available on other calibration standards. The AuSome™ resolution standards are available in three versions:

• Dual size gold particles; 117,3 and 27.3nm
• Single size 38nm gold particles
• Single size 27.3nm gold particles

The gold particles are uniformly deposited on a smooth 5x5mm silicon chip with a thickness of 0.5mm (#16008), unmounted or provided on an SEM specimen mount. See mount selection A-Q

AuSome™ Dual Size Gold Particles Standard

AuSome™ Dual Size 117.3 on 27.3nm

AuSome™ Dual Size 117.3 on 27.3nm

This AuSome™ resolution and calibration standard comprises a silicon substrate configured with two discreet populations of large and small gold particles. The larger (117.3nm, STDV 8.4nm) population of gold particles go from individual particles all the way up to large aggregates. These islands of aggregated particles can cover micron sized areas. The large aggregates provide reference points that are easy to focus on at low magnification; thus making the smaller (27.3nm, STDV 6.3nm) particles easy to find. The small clusters of 117.3nm gold particles provide the sites to check resolution and calibration in the submicron range. The small 27.3nm gold particles represent the AuSome™ coating on the silicon substrate to provide high magnification resolution check. AuSome™ provides a continuous monolayer of gold nanoparticles with uniform particle size and inter-particles spacing over the majority of the substrate with a higher density at the edges and corner.
Unmounted or provided on an SEM specimen mount. See mount selection A-Q

AuSome™ Single Size 38nm Gold Particles Standard

AuSome™ Single Size 38±4nm

The single particle AuSome™ resolution and calibration standard with 38±4nm gold particles provide an easy way of checking resolution at high magnification. The 38nm test standards tend to have a higher density, suitable for SEM and FESEM. AuSome™ provides a continuous monolayer of gold nanoparticles with uniform particle size and inter-particles spacing over the majority of the substrate with a higher density at the edges and corner. Silicon substrate size is 5x5mm with a thickness of 0.5mm. (#16008) Unmounted or provided on an SEM specimen mount. See mount selection A-Q

AuSome™ Single Size 27.3nm Gold Particles Standard

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AuSome™ single size 27.3nm

The single particle AuSome™ resolution and calibration standard with 27.3nm (STDV 6.3nm) gold particles provide an easy way of checking resolution at high magnification. Intended to be used with FESEM at higher magnifications. AuSome™ provides a continuous monolayer of gold nanoparticles with uniform particle size and inter-particles spacing over the majority of the substrate with a higher density at the edges and corner. Silicon substrate size is 5x5mm with a thickness of 0.5mm (#16008). Unmounted or provided on an SEM specimen mount. See mount selection A-Q