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This specimen is also used for contamination measurement rates in the electron microscope by noting the deposition rate of carbon within the holes found in the gold film.
The nominal value of the effective camera length of an EM operating in the selected area mode is not sufficiently accurate for calculations of lattice spacing. The actual value of camera length must be calibrated at the same accelerating voltage and objective lens setting by reference to a known substance with well defined diffraction spacings. A normal specimen is evaporated film of aluminum with a thickness of around 31nm. Very small crystallite size yields ring patterns suitable for calibration. The specimen is supplied with a list of the principal lattice spacings. Made on a G400, 400 square mesh copper Gilder grid.
PELCO® Technical Notes, Diffraction Standard Evaporated Aluminum, #619 (417KB PDF)
When changing from a selected area image of a specimen to a diffraction pattern, the strength of the intermediate lens is changed, producing an image rotation between the image and the diffraction pattern. This rotation is seen by photographing a crystal whose shape gives a clear indication of orientation. A molybdenum trioxide crystal is suitable for this purpose. Supported on a G400, 400 square mesh copper Gilder grid.
PELCO® Technical Notes, Image Rotation Molybdenum Trioxide Crystals, #625 (469KB PDF)
Carbon replica with Au/Pd shadowing on a cross line grating with well-defined trench type grooves. Pitch or "d" spacing for parallel line grating is 500nm. The trench type groove makes it easy to measure the pitch. Typically, cross line grating is used up to 100,000x with 2,000 lines/mm in both directions. Instructions included. Made on a G400, 400 square mesh copper grid.
PELCO® Technical Notes, 2000 l/mm Cross Line Grating Replica, #677 (420KB PDF)
Two-in-one; this standard for calibration provides a double-check of the accuracy of magnification calibration. It is particularly useful at higher magnification; up to 150,000x. The latex sphere size is 261nm and the carbon cross line grating replica with Au/Pd shadowing has a pitch or "d" spacing of 500nm or 2000 lines/mm. Replica has well-defined trench type grooves, which makes it easy to measure the 500nm pitch. Supplied on a G400, 400 square mesh copper grid.
PELCO® Technical Notes, 500nm Diffraction Grating Replica with Latex Spheres, #673 (374KB PDF)
Carbon replicas with Au/Pd shadowing of diffraction line gratings, parallel line, waffle pattern gratings. Made on a G400, 400 square mesh copper Gilder grid. Typically, parallel is used up to ~40-50,000x, while the waffle is used up to ~80-100,000x. Parallel line gratings are 2,160 lines/mm (54,864 lines/inch). The waffle is 2,160 lines/mm in both directions. Line or "d" spacing for parallel line grating is 462.9nm. Instructions included.
PELCO® Technical Notes, Magnification Calibration Diffraction Grating Replica, #606 (463KB PDF) PELCO® Technical Notes, Magnification Calibration Diffraction Grating Replica, #607 (498KB PDF)
magnification calibration specimen
Two-in-one; this standard for calibration provides a double-check of the accuracy of magnification calibration. It is particularly useful at higher magnification. The latex sphere size is 0.261 µm and the carbon grating replica with Au/Pd shadowing is 2160 lines/mm. Supplied on a G400, 400 square mesh copper Gilder grid.
PELCO® Technical Notes, Magnification Calibration Latex Spheres on Diffraction Grating Replica, #603 (400KB PDF)
These are latex particles of 0.204µm diameter shadowed with a fairly heavy coating of gold. The gold forms islands of strongly scattering material and produces a suitable test object for STEM.
PELCO® Technical Notes, Gold Shadowed Latex Point Separation Resolution Test, #628-B (250KB PDF)