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SEM Supplies & Accessories Overview
A new fundamentally improved pin stub for correlative, corroborative and repetitive microscopy.
The sample surface of the PELCO® Q Stubs is square for easy alignment of the sides of the Q Stub with the X and Y movements of the sample stage. An additional advantage is the larger sample surface area; over 20% larger than round stubs. Below the square top, the PELCO® Q Stubs are identical to the conventional round pin mounts and are fully compatible with existing SEM grippers, storage boxes, sample preparation equipment and most multiple pin stub holders. Carbon tape such as #16073-1 can be used to make carbon tabs which cover the complete square surface.
The PELCO® Q Pin Stubs are available in 12.7mm (1/2"), 19mm (3/4") and 25.4mm (1") square sample surface and a standard 3.2mm (1/8") pin. Compatible with SEMs, FESEMs and SEM/FIB systems from FEI/Philips, Tescan, Cambridge, Leica, Amray, ASPEX, and Camscan. Also suitable for ZEISS/LEO if they can cope with the longer 9mm pin instead of the standard 6mm pin.
Features and benefits of the PELCO® Q Pin Stubs
Engraved PELCO® Q Pin Stubs
The PELCO® Q Pin Stubs are available with an engraved lines to accommodate multiple small samples on one stub and to simplify indexing. The sharp notch can be used as master reference point and the engraved crosses can be used as sub-reference point; ideal for low magnification applications. The engraved lines divide the PELCO® Q Pin Stubs in equal sized squares of 6.3 x 6.3mm (1/4" x 1/4").
In this simplified round Q Pin Stub, the 90° notch can be used as an origin reference point for the SEM stage. Ideal for low magnification correlated imaging.
Enabling correlative and corroborative microscopy.